- Oct 9, 1999
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Do you think you have a better chance of getting better silicon towards the end of a production run for a line of chips rather than towards the beginning?
Here's my thought.
Let's take the Raptor Lake 8+16 die as an example. AFAIK it's binned as follows:
13900 (various designations)
13700
13600
13500?
Anyway let's say you were going to purchase a 13600K. This would be a die with at least 6 P's operational and 8 E's operational.
These would be binned K's, non numbered, and T's. Further complicating the issue is the fact that many of these parts will be artificially limited meaning operational cores fused off to make 6+8.
So in the beginning of the production run for this die all of the best parts are going KS, then K. After that all fully operational ones probably going non numbered and then T.
But as the yields get better and the SP rating of the silicon gets better I would assume the SP rating of the dies simply gets better on average.
So all of the best parts are going to be KS and they're all going to be really great. The 13900K's will get better just because they may actually have K's that could be KS's.
In fact, is it possible that some of the 13700K's could be really high SP rated with 8 E's fused off as the yields have gotten so good?
Do you think they were binning 13900KS parts right from the beginning or what is something like a few "tweaks" into the production run the machine that does the testing was logging some really great v/f curves and Intel noticed it?
Man I would love to see that binning data vs time for some dies.
Okay now have at me and let me know where I'm getting this all wrong/kind of right.
Here's my thought.
Let's take the Raptor Lake 8+16 die as an example. AFAIK it's binned as follows:
13900 (various designations)
13700
13600
13500?
Anyway let's say you were going to purchase a 13600K. This would be a die with at least 6 P's operational and 8 E's operational.
These would be binned K's, non numbered, and T's. Further complicating the issue is the fact that many of these parts will be artificially limited meaning operational cores fused off to make 6+8.
So in the beginning of the production run for this die all of the best parts are going KS, then K. After that all fully operational ones probably going non numbered and then T.
But as the yields get better and the SP rating of the silicon gets better I would assume the SP rating of the dies simply gets better on average.
So all of the best parts are going to be KS and they're all going to be really great. The 13900K's will get better just because they may actually have K's that could be KS's.
In fact, is it possible that some of the 13700K's could be really high SP rated with 8 E's fused off as the yields have gotten so good?
Do you think they were binning 13900KS parts right from the beginning or what is something like a few "tweaks" into the production run the machine that does the testing was logging some really great v/f curves and Intel noticed it?
Man I would love to see that binning data vs time for some dies.
Okay now have at me and let me know where I'm getting this all wrong/kind of right.