Originally posted by: dmens
Originally posted by: Idontcare
Seriously though what purpose (if you can tell us) does running these tests satisfy? I'm familiar with the standard elevated voltage/temperature test conditions for accelerated lifetime testing, but it sounds like in your case it is being done just to see what is limiting the clockspeed regardless of lifetime?
yeah i wanted to see where the wall was. this was with a tester, not a computing setup.
Awesome. I love the fact your employer empowers you with the right equipment and time/rope to run these kinds of tests. Even if they aren't fully reviewed/sanctioned tests as part of a larger organized internal study or project, the fact they don't go out of their way to stand in your way is pretty cool.
So what's the gut-perspective on HK/MG, does it enable you to go places with the design/clockspeed you simply could not have gone otherwise or is it more of a nice thing to have as it finely gets rid of some headache restrictions that were hobbling innovation at the architecture/design/layout level? (asking for just your personal perspective, not your employer's, if you are comfortable discussing it even under such pretense)
SUN always gave us the strong impression HK/MG was a nice to have, but not a need to have. Meaning they didn't feel the spice-models and xtor device physics of traditional doped-poly gates and plasma nitrided gate oxide were a critically limiting factor in their IC designs. We had HK ready for deploy since 90nm but they never wanted it (cost factor) so we never went to production with it, I suspect this is the case with nearly all the major IDM's as our benchmarking results usually concluded as much. Although I must admit Intel was absolutely never on our radar as being a contender for deploying HK/MG at 45nm. Total surprise.